Measuring Station MarSurf CP Select 200x200

Measuring Station MarSurf CP Select 200×200

£43,814.80 excl. VAT

Measuring Station MarSurf CP Select 200×200

MarSurf CP Portal S 200×200 – incl. (portal stand, axes XY)
Integrated off axis camera
Measurement system computer 19″ Basic

 

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Product Description

Measuring Station MarSurf CP Select 200×200 – Optical 3D Profileometry

Measuring Station MarSurf CP Select 200×200- Consisting of:

  • MarSurf CP Portal S 200×200 – incl. (portal stand, axes XY).
  • Integrated off axis camera.
  • Measurement system computer 19″ Basic.

The compact MarSurf CP optical profilometers for the three dimensional measurement and analysis of surfaces – non-tactile, independent of material and fast.

They are characterized by an extremely fast detection of large measuring surfaces with simultaneously high measuring precision.

The established optical measuring system is successfully used for example

  • Roughness measurement according to DIN EN ISO 4287.
  • Topography measurement (including volume, wear, isotropy).
  • Measurement of macro and microgeometries.
  • Determination of flatness and coplanarity.

Thanks to their modular design, the measuring systems can be adapted to different measuring tasks and individual requirements for automation, measuring comfort and accuracy. Depending on the measuring task, various sensors can be flexibly selected. Axis systems as well as software modules can be combined individually.

The MarSurf CP meet your individual requirements for automation, measuring comfort and accuracy – right up to the fully automated measuring solution.

MarSurf CD-140 BG11


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FEATURES

  • Large-scale 3D measurement
  • Very high measuring speed
  • User-independent serial measurements by automation software
  • Excellent flank acceptance
  • Layer thickness measurement and measurement of transparent materials
  • Large height measuring range with large working distance
  • Robust and reliable
  • User-friendly concept

Applications

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volume

Electronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products

Medical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision

Technical Data

MarSurf CP Portal S 200 x 200 - incl. (portal stand, axes XY)
Integrated off axis camera
Measurement system computer 19" Basic